A Note on Polynomial Identity Testing for Depth-3 Circuits

05/17/2018
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by   V. Arvind, et al.
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Let C be a depth-3 arithmetic circuit of size at most s, computing a polynomial f ∈F[x_1,..., x_n] (where F = Q or C) and the fan-in of the product gates of C is bounded by d. We give a deterministic polynomial identity testing algorithm to check whether f≡ 0 or not in time 2^d poly(n,s) .

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